A Brief Introduction to Atomic Force Microscopy
نویسنده
چکیده
In 1986, Gerd Binnig and Heinrich Rohrer won the Nobel Prize in Physics for the invention of the scanning tunnelling microscope (STM) and the fact that it could achieve atomic resolution. They observed that if they held a metallic tip of 10 angstrom above a conductive surface, they could measure a tunnelling current in the order of a nanoampere. When the tip was then scanned over the conducting sample, the topography of the surface could be plotted by measuring the distance-dependent tunnelling current. The STM was a revolution in the field of high resolution microscopy, however, this technique could only be used to image conducting samples.
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